Investigation of effective annealing on CdMnTe:In crystals with different thickness for gamma-ray detectors

Publication date: 1 February 2018
Source:Journal of Crystal Growth, Volume 483
Author(s): Pengfei Yu, Yadong Xu, Yongren Chen, Jie Song, Yi Zhu, Meijing Zhang, Binggang Zhang, Yu Wang, Wei Li, Lijun Luan, Yuanyuan Du, Jing Ma, Jiahong Zheng, Zhuo Li, Min Bai, Hui Li, Wanqi Jie
Radiation detectors with different thickness are needed to detect gamma rays with various energies. In this paper, a post-growth annealing method was used to improve the properties of CdMnTe:In (CMT:In) crystals with different thickness for gamma-ray detectors. The results indicated that Te inclusions in CMT:In crystals with different thickness were reduced remarkably after annealing. Both the resistivity and IR transmittance of annealed CMT:In crystals with different thickness increased obviously, which suggested that the crystal quality was improved. For the detectors fabricated by annealed CMT:In slices with 1 mm, 2 mm and 5 mm thickness, the energy resolutions were enhanced about 252%, 193% and 141%, respectively. And (μτ)e values were enhanced about 80%, 80% and 76%, respectively. The performance of the detectors was greatly improved after annealing.